Experiment A and B
- Initial
Replication
Cell:
- Cathode:
3.5 cm of exposed 0.25mm Ag wire as close as possible to 1 cm x 2 cm
Landauer CR-39 chip.
- Anode:
Approximately 20 cm of 0.3mm Pt wire
- A:
with magnets
- B:
without magnets
Electrolyte:
- 33
gm D2O + 0.42 gm LiCl + 0.176 gm PdCl2 (for one cell)

Procedure:
- 0.28
mA for 8 hours (1 mA/cm^2)
- 0.83
mA for 8 hours (3 mA/cm^2)
- added
magnets to cell A (we received the official TGP protocol at this time)
- 1.37
mA until clear – 12 days (5 mA/cm^2)
- 5
mA for 24 hours
- 10
mA for 24 hours
- 25
mA for 24 hours
- 50
mA for 24 hours
- 100
mA for 48 hours
Etch:
Results
(Started on 12.5.06 Ended on 12.24.06):
- Cell
A had about 200 gauss at cathode location, B had 20 gauss at cathode
location
- Cell
walls were damaged during run
- Chips
appeared unaltered and clear until the removal of the cathode.
Underneath the cathode, there was a distinct, cloudy line
- After
etching, the cloudy line under the cathode was noticeably raised
- 790
microns at the thinnest point in the bulk material (A)
- 870
microns at the thickest point on the ridge (A)
(Experiment B shown for
clarity – no magnets)
Damage to the cell walls:
CR-39:
|
(camera operator error...sorry)
Pre-etch |
Pre-etch 40x
Pre-etch
400x
|
|
Post etch: "A" (magnets)
|
Post etch:
"B" (no magnets) |
|
|
|
|
Post etch photomicrographs of unusual features |
| A: 400x
Abrupt "edge" |
 |
| A: 400x
Blank line - possibly from Ag wire contact |
 |
| A: 100x
Damage - mechanical? chemical? |
 |
| A: 200x
Same damage |
 |
| A: 400x
Same damage |
 |
| A: 400x
Another area with similar damage (much more
localized) |
 |
| B: 200x
"The line" - it can also be seen on the
40x photo of B above |
 |
| B: 200x
Dead zone - possibly from Ag wire |
 |
| B: 400x
Abrupt "edge" |
 |
| B: 400x
"Tracks" well away from cathode - and
about half the size |
 |